Janusz Rajski, vice president of Engineering, Tessent, joined Mentor Graphics in 1995 as chief scientist and in 2002 became engineering director of the Tessent product line. During his tenure at Mentor he has built a strong R&D organization with focus on innovative Design for Test technologies and collaboration with leading semiconductor companies. Under his leadership the team has developed a number of revolutionary industry-first products: TestKompress, the first commercial test compression product, and Cell-Aware Test technology which provides unprecedented test quality and accuracy of diagnosis. Both are increasingly important for smaller technology nodes and automotive applications.
Prior to joining Mentor, he was a faculty member with the Poznań University of Technology. In 1984, he joined McGill University, Montréal, Canada, where he became an associate professor in 1989. He has published more than 240 IEEE research papers and is co-inventor of more than 120 US and international patents. His papers and patents have over 12,700 citations and won many prestigious awards.
A Lifetime Fellow of the IEEE, he holds a Master of Science degree in electrical engineering from the Gdańsk University of Technology and a Ph.D. degree in electrical engineering as well as an honorary doctorate from the Poznań University of Technology. In 2003, he was awarded the prestigious title of “Professor of Science” by the President of Poland. In 2009 he received the Stephen Swerling Innovation Award from Mentor Graphics “for his breakthrough innovation, TestKompress, and his many contributions to revitalizing Mentor's DFT business to its current position as #1 test business in EDA”. In 2018, Rajski received the Siemen’s Lifetime Achievement Award for his extensive contributions to DFT.
Title: Managing Product Lifecycles in Automotive Electronics
Abstract: The Information Age gave us very efficient means of processing, accessing and communicating information. The computer systems of that age, while being fast and precise, were not intelligent. They didn’t learn with time and, until now, no computer have passed the Turing test of intelligence. Although in 1997, IBM’s Deep Blue beat Kasparov in chess game, it was all through brute force, domain knowledge and massive computer power, not learning.
In 2017 Google introduced AlphaZero, an Artificial Intelligence (AI) system capable of learning how to play some of the most difficult games to master, like the Japanese chess and Chinese Go and beating the best players. It was a true milestone marking the beginning of a new technological era. Thanks to the progress in AI, semiconductors and computers, we have entered the Autonomous Age where computer systems not only process, store and communicate information but also learn, make decision and take actions autonomously.
The most recognizable form of autonomous age are driverless cars. The autonomous capability, electrification and connectivity attract a lot of investments in electronics. The automotive electronics market is growing at 14% CAGR and is expected to reach $160 billion in 2022. Approximately 300 companies are developing electric cars and trucks and 100 companies have announced autonomous drive programs. Eight of the world’s most innovative companies, including Apple, Google, Tesla, Microsoft and Amazon are active in the automotive development.
The autonomous age will go far beyond transportation. McKinsey Global Institute estimates that in 60% of all occupations, 30% of activities can be fully automated. This will have a profound impact on the structure of future employment. Intelligent robots and AI will displace approximately 1 billion of factory workers and another 1 billion of service workers by 2030. Amazon has more than 100,000 intelligent robots in operation worldwide.
Many electronic components used in driverless cars and collaborative robots perform safety critical functions. One of the most important requirements to ensure functional safety which the ISO 26262 defines as the “absence of unreasonable risk due to hazards caused by malfunctioning behavior of electrical/electronic systems”. It is also one of the most significant challenges. Some integrated circuits used in these applications may have more than 10 billion transistors and require 500 distinct manufacturing steps. The first challenge is to make sure that there is less than one defective component for every million chips shipped from the fab. In addition, the functional safety requires that the safety critical circuits test themselves during system operation and should defects occur, they have to put the whole system in a safe state to avoid the system failure. The highest standard for Automotive Safety Integrity Level (ASIL D) requires that the system failure occurs less than 100 times for one billion hours of operation.
In this talk we will review the challenges at various phases of the design, manufacturing, system operation and analysis of field returns of electronic products designed for safety critical applications of autonomous systems.
Appointed as Undersecretary of State in the Ministry of Development in November 2015. In 1999–2002, worked in the Department of Foreign Affairs at the Chancellery of the Prime Minister. In 2009, became the Director of the Museum of Polish People’s Republic (PRL) in Kraków. Is a councillor in the regional assembly of Małopolskie Voivodeship and Vice-Chair of the Commission for the Innovation and Modern Technologies.
Jadwiga Emilewicz is a graduate of the Institute of Political Studies at the Jagiellonian University. She has begun doctoral studies at the Jagiellonian University’s Department of International and Political Studies. She is a holder of Oxford University scholarship, as well as scholarship granted under the American Council on Germany programme by Dräger Foundation, ZEIT-Stiftung Ebelin und Gerd Bucerius. She has been associated with Tischner European University in Kraków since 2003. A social worker, the author of numerous scientific publications. The former President of the “Better Poland” Foundation. She speaks English, German and French.